Abstract: One of the primary challenges in advanced manufacturing (AM) is the lack of efficient optical metrics for ensuring quality control over the manufacturing process. Many current imaging techniques have excessive data requirements and require computationally intensive post-processing to effectively characterize various AM environments. Spatial frequency modulated imaging (SPIFI) addresses many of these issues with the following benefits: it is compatible with long working distance optics, provides a large field-of-view, features single element detection, and can provide enhanced resolution. Here, we demonstrate SPIFI with enhanced resolution in multiple dimensions for the first time. This is achieved by incorporating multiple linear extended excitation sources oriented with axes at arbitrary angles with respect to each other. The system utilizes a single modulation mask enabling facile implementation within existing imaging systems such as those found in laser AM systems.